IEEE Project Titles, ESTIMATION OF DEFECTS BASED ON EFECT DECAY MODEL: ED3M

.Net Projects ( major )	Java Projects ( major )	VB Projects ( major )	Php Projects ( major )	Vc++ Projects ( major )	SQL projects ( major )	IEEE ECE Projects
C&Ds projects ( major )	C++ projects ( major )	Perl projects ( major )	Cold Fusion Projects	ASP projects ( major )	Delphi projects ( major )	IEEE CSE Projects

Custom Search

What is 1000Projects
'1000projects.com' is an educational content website dedicated to finding and realizing Final Year Projects, IEEE Projects, Engineering Projects, Science Fair Projects, Project Topics, Project Ideas, Major Projects, Mini Projects, Paper Presentations, Presentation Topics, IEEE Topics, .Net Projects, Java Projects, PHP Projects, VB Projects, SQL Projects, C & DS Projects, C++ Projects, Perl Projects, ASP Projects, Delphi Projects, HTML Projects, Cold Fusion Projects, Java Script Projects, Btech Projects, BE Projects, MCA Projects, Mtech Projects, MBA Projects, Project on Software, CBSE Projects, Testing Projects, Embedded Projects, Chemistry Projects, Electronics Projects, Electrical Projects, Science Projects, Mechanical Projects, Mba project Reports, Placement papers, Sample Resumes, Entrance Exams, Technical Faq's, Puzzles, etc

how it works?

Everything on this site is submitted by the students in this professional community. You Can submit your Projects, Project Topics & Ideas to info.1000projects{at}gmail.com after you submit your project/project Idea/Abstract/Seminar Topics, These are being verified and approved by our administrator. after approval of this project/project Idea/Abstract/Seminar Topics, It can be shown on 1000projects.com so that other users can read/discuss it.The entire content on this website is Only For Educational Purpose, Non Commercial use!

Please help us/Other Users by sending projects/project Ideas/Abstracts/Seminar Topics. Thanking You!!!!!

ESTIMATION OF DEFECTS BASED ON EFECT DECAY MODEL: ED3M
SOFTWARE ENGINEERING
DOT NET
An accurate prediction of the number of defects in a software product during system testing contributes not only to the management of the system testing process but also to the estimation of the product’s required maintenance. Here, a new approach, called Estimation of Defects based on Defect Decay Model (ED3M) is presented that computes an estimate the defects in an ongoing testing process. ED3M is based on estimation theory. Unlike many existing approaches, the technique presented here does not depend on historical data from previous projects or any assumptions about the requirements and/or testers’ productivity. It is a completely automated approach that relies only on the data collected during an ongoing testing process. This is a key advantage of the ED3M approach as it makes it widely applicable in different testing environments. Here, the ED3M approach has been evaluated using five data sets from large industrial projects and two data sets from the literature. In addition, a performance analysis has been conducted using simulated data sets to explore its behavior using different models for the input data. The results are very promising; they indicate the ED3M approach provides accurate estimates with as fast or better convergence time in comparison to well-known alternative techniques, while only using defect data as the input.